Tektronix TCA-1MEG High-impedance Buffer Amplifier System

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-Tektronix TCA-1MEG High-impedance Buffer Amplifier System

Product Overview
The Tektronix TCA-1MEG high-impedance buffer amplifier system extends the capabilities of Tektronix high-performance oscilloscopes, making them ideal for a variety of general purpose measurements. The TCA-1MEG amplifier system provides a 1 MΩ path that is easily removed and replaced with a wide array of TekConnect probes, amplifiers and adapters.

This amplifier system delivers versatility to Tektronix high-performance oscilloscopes through the addition of input coupling (selectable), bandwidth limit (selectable), and a 1 MΩ input that provides access to a wide array of measurement solutions. These solutions include general-purpose passive probes, high voltage probes (passive single-ended and active differential), micro-volt differential probes and current probes.

With this tool, Tektronix high-performance oscilloscopes may now perform measurements such as primary and secondary power supply voltage levels, currents and elevated voltages, and assess the power requirements of the device-under-test.

For today’s high-speed measurement solutions, having the 50 Ω and 1 MΩ terminations on the same input path compromises signal fidelity. By making the 1 MΩ path replaceable, the TCA-1MEG high impedance buffer amplifier system eliminates a permanent degradation of the high-speed signal path. This also allows users to easily and quickly configure each channel for the input characteristics required for their measurements. By exchanging the TCA-1MEG for a high-performance 50 Ω path or other high-speed probing solution, maximum signal fidelity is maintained at the oscilloscope’s input.

Features:

  • TekConnect Interface Delivers Superior Signal Fidelity, Unparalleled Versatility and Ease-of-use
  • Input Coupling: DC/AC/GND
  • Input Impedance: 1 MΩ/10 pF
  • Bandwidth: DC to > 500 MHz
  • Bandwidth Limiting: Full/100 MHz/20 MHz
  • Includes P6139A, 500 MHz, 10X Passive Probe

Applications:

Verification, Characterization and Debug of Sophisticated Designs in Communications, Computer and Semiconductor Electronic Environments

  • Jitter and Timing Analysis (Computer Systems)
  • Disk Drive Analysis
  • Investigation of Transient Phenomena
  • Spectral Analysis
  • Power Supplies/Inverters (Switching and Linear)
  • Semiconductor Devices (SCRs, IGBTs, FETs, CMOS)
  • Electronic Ballasts
  • Industrial/Consumer Electronics
  • Mobile Communications (Phone, Satellite, Relay Stations)
  • Motor Drives
  • Transportation Systems (Electronic Vehicles, Electric Trains, Locomotives, Avionics)



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