Keithley 2425 100W SourceMeter w/ Measurements up to 100V and 3A

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Keithley 2425 100W SourceMeter w/ Measurements up to 100V and 3A
-Power cable

Product Overview
The Keithley 2425 100V/3A/100W SourceMeter SMU Instrument is designed specifically for test applications that demand tightly coupled sourcing and measurement. The 2425-C provides precision voltage and current sourcing as well as measurement capabilities; it is both a highly stable DC power source and a true instrument-grade 6 1/2-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, this instrument can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the 2425-C invaluable for a wide range of characterization and production test applications.

Features
Five instruments in one (IV Source, IVR Measure)
100V, 3A, 100W
Source and sync (4-quadrant) operation
0.012% basic measure accuracy
6 1/2-digit resolution
2-, 4-, and 6-wire remote V-source and measure sensing
1700 readings/second at 4 1/2 digits via GPIB
Pass/Fail comparator for fast sorting/binning
Programmable DIO port for automation/handler/prober control
Standard SCPI GPIB, RS-232 and Keithley Trigger Link interfaces

Applications
Discrete semiconductor devices
Passive devices
Transient suppression devices
ICs, RF ICs, MMICs
Laser diodes, laser diode modules, LEDs, photodetectors
Circuit protection devices (TVS, MOV, Fuses, etc.)
Airbags
Connectors, switches, relays
High brightness LEDs (DC and pulse)
Leakage tests
Low voltage/resistances tests
LIV tests
IDDQ tests
I-V characterization tests
Isolation and trace resistance tests
Temperature coefficient tests
Forward voltage, reverse breakdown, leakage current tests
DC parametric test
DC power source tests
HIPOT tests
Photovoltaic cell efficiency (source and sync) tests
Dielectric withstanding tests


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